Part Number Hot Search : 
AA4040 X24C45 Z5238 MC68HC90 LTC5536 LC898 LA3373 TDA4863G
Product Description
Full Text Search
 

To Download FQD16N25CTF Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 FQD16N25C 250V N-Channel MOSFET
March 2006
QFET
FQD16N25C
250V N-Channel MOSFET
Features
* * * * * * 16A, 250V, RDS(on) = 0.27 @VGS = 10 V Low gate charge ( typical 41 nC) Low Crss ( typical 68 pF) Fast switching 100% avalanche tested Improved dv/dt capability
(R)
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switching DC/DC converters, switch mode power supplies, DC-AC converters for uninterrupted power supplies and motor controls.
D
D-PAK
FQD Series
G
S
Absolute Maximum Ratings
Symbol
VDSS ID IDM VGSS EAS IAR EAR dv/dt PD TJ, TSTG TL Drain-Source Voltage Drain Current Drain Current - Continuous (TC = 25C) - Continuous (TC = 100C) - Pulsed
(Note 1)
Parameter
FQD16N25C
250 16 10.1 64 30
(Note 2) (Note 1) (Note 1) (Note 3)
Units
V A A A V mJ A mJ V/ns W W/C C C
Gate-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25C) - Derate above 25C Operating and Storage Temperature Range Maximum lead temperature for soldering purposes, 1/8 from case for 5 seconds
432 16 160 5.5 160 1.28 -55 to +150 300
Thermal Characteristics
Symbol
RJC RJA
Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Junction-to-Ambient
FQD16N25C
0.78 110
Units
C/W C/W
(c)2006 Fairchild Semiconductor Corporation
1
www.fairchildsemi.com
FQD16N25C Rev. A
FQD16N25C 250V N-Channel MOSFET
Package Marking and Ordering Information
Device Marking
FQD16N25C FQD16N25C
Device
FQD16N25CTM FQD16N25CTF
Package
D-PAK D-PAK
TC = 25C unless otherwise noted
Reel Size
380mm 380mm
Tape Width
16mm 16mm
Quantity
2,500 2,000
Electrical Characteristics
Symbol
Off Characteristics BVDSS BVDSS/ TJ IDSS IGSSF IGSSR VGS(th) RDS(on) gFS Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd IS ISM VSD trr Qrr
NOTES:
Parameter
Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse Gate Threshold Voltage Static Drain-Source On-Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge
Test Conditions
VGS = 0 V, ID = 250 A ID = 250 A, Referenced to 25C VDS = 250 V, VGS = 0 V VDS = 200 V, TC = 125C VGS = 30 V, VDS = 0 V VGS = -30 V, VDS = 0 V VDS = VGS, ID = 250 A VGS = 10 V, ID = 8A VDS = 40 V, ID =8 A VDS = 25 V, VGS = 0 V, f = 1.0 MHz
(Note 4)
Min
250 -----2.0 ------
Typ
-0.31 -----0.22 10.5 830 170 68
Max Units
--10 100 100 -100 4.0 0.27 -1080 220 89 V V/C A A nA nA V S pF pF pF ns ns ns ns nC nC nC
On Characteristics
Dynamic Characteristics
Switching Characteristics VDD = 125 V, ID = 16A, RG = 25 ---(Note 4, 5)
15 130 135 105 41 5.6 22.7 ---260 2.47
40 270 280 220 53.5 ---
----
VDS = 200 V, ID = 16A, VGS = 10 V
(Note 4, 5)
--
Drain-Source Diode Characteristics and Maximum Ratings Maximum Continuous Drain-Source Diode Forward Current Maximum Pulsed Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0 V, IS = 16 A VGS = 0 V, IS = 16 A, dIF / dt = 100 A/s
(Note 4)
------
16 64 1.5 ---
A A V ns C
1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L = 2.7mH, IAS = 16A, VDD = 50V, RG = 25 , Starting TJ = 25C 3. ISD 16A, di/dt 300A/s, VDD BVDSS, Starting TJ = 25C 4. Pulse Test : Pulse width 300s, Duty cycle 2% 5. Essentially independent of operating temperature
FQD16N25C Rev. A
2
www.fairchildsemi.com
FQD16N25C 250V N-Channel MOSFET
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
ID, Drain Current [A]
ID, Drain Current [A]
10
1
VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V 5.5 V 5.0 V Bottom : 4.5 V Top :
10
1
150 C
o
25 C
10
0
o
-55 C
o
10
0
Notes : 1. 250 s Pulse Test 2. TC = 25
Notes : 1. VDS = 40V 2. 250 s Pulse Test
10
-1
10
-1
10
0
10
1
10
-1
2
4
6
8
10
VDS, Drain-Source Voltage [V]
VGS, Gate-Source Voltage [V]
Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue
1.5
RDS(ON) [ ], Drain-Source On-Resistance
IDR, Reverse Drain Current [A]
1.0
10
1
VGS = 10V
0.5
10
0
150
VGS = 20V
25
Notes : 1. VGS = 0V 2. 250 s Pulse Test
Note : TJ = 25
0.0
0
10
20
30
40
50
10
-1
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
ID, Drain Current [A]
VSD, Source-Drain voltage [V]
Figure 5. Capacitance Characteristics
3000
Figure 6. Gate Charge Characteristics
2500
Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd
12
VGS, Gate-Source Voltage [V]
10
VDS = 50V VDS = 125V VDS = 200V
Capacitance [pF]
2000
8
Ciss
1500
Coss Crss
Notes : 1. VGS = 0 V 2. f = 1 MHz
0 1
6
1000
4
500
2
Note : ID = 15.6A
0 -1 10
0
10
10
0
10
20
30
40
50
VDS, Drain-Source Voltage [V]
QG, Total Gate Charge [nC]
FQD16N25C Rev. A
3
www.fairchildsemi.com
FQD16N25C 250V N-Channel MOSFET
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation vs. Temperature Figure 8. On-Resistance Variation vs. Temperature
1.2
3.0
BVDSS, (Normalized) Drain-Source Breakdown Voltage
1.1
RDS(ON), (Normalized) Drain-Source On-Resistance
2.5
2.0
1.0
1.5
1.0
Notes : 1. VGS = 10 V 2. ID = 8.9 A
0.9
Notes : 1. VGS = 0 V 2. ID = 250 A
0.5
0.8 -100
-50
0
50
100
o
150
200
0.0 -100
-50
0
50
100
o
150
200
TJ, Junction Temperature [ C]
TJ, Junction Temperature [ C]
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current vs. Case Temperature
20
10
2
Operation in This Area is Limited by R DS(on)
10 s 100 s 1ms
15
ID, Drain Current [A]
10
1
ID, Drain Current [A]
10ms 100ms DC
10
10
0
5
* Notes : o 1. TC = 25 C 2. TJ = 150 C 3. Single Pulse
o
10
-1
0
0
10
10
1
10
2
25
50
75
100
o
125
150
VDS, Drain-SourceVoltage[V]
TC, Case Temperature [ C]
Figure 11. Transient Thermal Response Curve
10
0
D=0.5
Z? JC Thermal Response (t),
0.2
10
-1
0.1 0.05 0.02 0.01
PDM t1 t2
10
-2
single pulse
* Notes : 0 (t) 1. Z? JC = 0.78 C/W Max. 2. Duty Factor, D=t1/t2 3. TJM - TC = PDM * Z? JC (t)
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t1, Square Wave Pulse Duration [sec]
FQD16N25C Rev. A
4
www.fairchildsemi.com
FQD16N25C 250V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FQD16N25C Rev. A
5
www.fairchildsemi.com
FQD16N25C 250V N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FQD16N25C Rev. A
6
www.fairchildsemi.com
FQD16N25C 250V N-Channel MOSFET
Mechanical Dimensions
D-PAK
6.60 0.20 5.34 0.30 (0.50) (4.34) (0.50)
0.70 0.20
2.30 0.10 0.50 0.10
0.60 0.20
6.10 0.20
2.70 0.20
9.50 0.30
0.91 0.10
0.80 0.20
MAX0.96 2.30TYP [2.300.20]
0.76 0.10 2.30TYP [2.300.20]
0.89 0.10
0.50 0.10 1.02 0.20 2.30 0.20
(0.70)
(0.90) (0.10) (3.05)
6.10 0.20
9.50 0.30
2.70 0.20
(2XR0.25)
0.76 0.10
Dimensions in Millimeters
(1.00)
www.fairchildsemi.com
6.60 0.20 (5.34) (5.04) (1.50)
FQD16N25C Rev. A
7
MIN0.55
FQD16N25C 250V N-Channel MOSFET
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACExTM ActiveArrayTM BottomlessTM Build it NowTM CoolFETTM CROSSVOLTTM DOMETM EcoSPARKTM E2CMOSTM EnSignaTM FACTTM FACT Quiet SeriesTM
FAST(R) FASTrTM FPSTM FRFETTM GlobalOptoisolatorTM GTOTM HiSeCTM I2CTM i-LoTM ImpliedDisconnectTM IntelliMAXTM
Across the board. Around the world.TM The Power Franchise(R) Programmable Active DroopTM
ISOPLANARTM LittleFETTM MICROCOUPLERTM MicroFETTM MicroPakTM MICROWIRETM MSXTM MSXProTM OCXTM OCXProTM OPTOLOGIC(R) OPTOPLANARTM PACMANTM POPTM Power247TM PowerEdgeTM
PowerSaverTM PowerTrench(R) QFET(R) QSTM QT OptoelectronicsTM Quiet SeriesTM RapidConfigureTM RapidConnectTM SerDesTM ScalarPumpTM SILENT SWITCHER(R) SMART STARTTM SPMTM StealthTM SuperFETTM SuperSOTTM-3
SuperSOTTM-6 SuperSOTTM-8 SyncFETTM TCMTM TinyLogic(R) TINYOPTOTM TruTranslationTM UHCTM UltraFET(R) UniFETTM VCXTM WireTM
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Advance Information Product Status Formative or In Design First Production Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I18
Preliminary
No Identification Needed
Full Production
Obsolete
Not In Production
8 FQD16N25C Rev. A
www.fairchildsemi.com


▲Up To Search▲   

 
Price & Availability of FQD16N25CTF

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X